A dV/dt noise canceling circuit of capacitive-isolated gate drivers

For capacitive-isolated gate drivers, the pulse width distortion (PWD) and common mode transient immunity (CMTI) are vital factors to evaluate its performance. In this paper, an envelope detection circuit a dV/dt noise canceling of drivers is designed based on X-FAB 0.35µm CMOS process. With these structures, driver alleviates PWD improve CMTI. Spectre simulation results show that achieves 200kV/µs CMTI with 50ns propagation delay maximum 7.4ns PWD. Besides, it has better robustness fabrication process temperature variation than conventional methods.